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Pixel Charge Profiles in Run-2 Data and Simulation
The pixel charge profile (normalised average pixel charge as a function of the production depth) is sensitive to the irradiation of the silicon substrate. For a non irradiated fully depleted pixel detector, the charge profile is expected to be flat. For an irradiated detector, losses in the collect...
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| Lenguaje: | eng |
| Publicado: |
2020
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| Acceso en línea: | http://cds.cern.ch/record/2720551 |