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Characterization in Silicon Processing
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Newnes
2013
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2726114 |
| _version_ | 1780966086159630336 |
|---|---|
| author | Strausser, Yale |
| author_facet | Strausser, Yale |
| author_sort | Strausser, Yale |
| collection | CERN |
| id | cern-2726114 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2013 |
| publisher | Newnes |
| record_format | invenio |
| spelling | cern-27261142021-04-21T18:07:15Zhttp://cds.cern.ch/record/2726114engStrausser, YaleCharacterization in Silicon ProcessingXXNewnesoai:cds.cern.ch:27261142013 |
| spellingShingle | XX Strausser, Yale Characterization in Silicon Processing |
| title | Characterization in Silicon Processing |
| title_full | Characterization in Silicon Processing |
| title_fullStr | Characterization in Silicon Processing |
| title_full_unstemmed | Characterization in Silicon Processing |
| title_short | Characterization in Silicon Processing |
| title_sort | characterization in silicon processing |
| topic | XX |
| url | http://cds.cern.ch/record/2726114 |
| work_keys_str_mv | AT strausseryale characterizationinsiliconprocessing |