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Introduction to Optical Metrology
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
CRC Press
2017
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2726429 |
_version_ | 1780966156396396544 |
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author | Sirohi, Rajpal |
author_facet | Sirohi, Rajpal |
author_sort | Sirohi, Rajpal |
collection | CERN |
id | cern-2726429 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
publisher | CRC Press |
record_format | invenio |
spelling | cern-27264292021-04-21T18:06:41Zhttp://cds.cern.ch/record/2726429engSirohi, RajpalIntroduction to Optical MetrologyXXCRC Pressoai:cds.cern.ch:27264292017 |
spellingShingle | XX Sirohi, Rajpal Introduction to Optical Metrology |
title | Introduction to Optical Metrology |
title_full | Introduction to Optical Metrology |
title_fullStr | Introduction to Optical Metrology |
title_full_unstemmed | Introduction to Optical Metrology |
title_short | Introduction to Optical Metrology |
title_sort | introduction to optical metrology |
topic | XX |
url | http://cds.cern.ch/record/2726429 |
work_keys_str_mv | AT sirohirajpal introductiontoopticalmetrology |