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Introduction to statistics in metrology
This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studi...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2020
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-030-53329-8 http://cds.cern.ch/record/2746915 |