Cargando…
Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
Autores principales: | , , , |
---|---|
Lenguaje: | eng |
Publicado: |
1994
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/274861 |
_version_ | 1780887413720088576 |
---|---|
author | Alexeev, A G Savitskaya, E N Kharlampiev, S A Kurochkin, V P |
author_facet | Alexeev, A G Savitskaya, E N Kharlampiev, S A Kurochkin, V P |
author_sort | Alexeev, A G |
collection | CERN |
id | cern-274861 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1994 |
record_format | invenio |
spelling | cern-2748612019-09-30T06:29:59Zhttp://cds.cern.ch/record/274861engAlexeev, A GSavitskaya, E NKharlampiev, S AKurochkin, V PDose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devicesHealth Physics and Radiation EffectsIHEP-94-65oai:cds.cern.ch:2748611994-06-06 |
spellingShingle | Health Physics and Radiation Effects Alexeev, A G Savitskaya, E N Kharlampiev, S A Kurochkin, V P Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
title | Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
title_full | Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
title_fullStr | Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
title_full_unstemmed | Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
title_short | Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
title_sort | dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices |
topic | Health Physics and Radiation Effects |
url | http://cds.cern.ch/record/274861 |
work_keys_str_mv | AT alexeevag dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices AT savitskayaen dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices AT kharlampievsa dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices AT kurochkinvp dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices |