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Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices

Detalles Bibliográficos
Autores principales: Alexeev, A G, Savitskaya, E N, Kharlampiev, S A, Kurochkin, V P
Lenguaje:eng
Publicado: 1994
Materias:
Acceso en línea:http://cds.cern.ch/record/274861
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author Alexeev, A G
Savitskaya, E N
Kharlampiev, S A
Kurochkin, V P
author_facet Alexeev, A G
Savitskaya, E N
Kharlampiev, S A
Kurochkin, V P
author_sort Alexeev, A G
collection CERN
id cern-274861
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1994
record_format invenio
spelling cern-2748612019-09-30T06:29:59Zhttp://cds.cern.ch/record/274861engAlexeev, A GSavitskaya, E NKharlampiev, S AKurochkin, V PDose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devicesHealth Physics and Radiation EffectsIHEP-94-65oai:cds.cern.ch:2748611994-06-06
spellingShingle Health Physics and Radiation Effects
Alexeev, A G
Savitskaya, E N
Kharlampiev, S A
Kurochkin, V P
Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
title Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
title_full Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
title_fullStr Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
title_full_unstemmed Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
title_short Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
title_sort dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
topic Health Physics and Radiation Effects
url http://cds.cern.ch/record/274861
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AT savitskayaen dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices
AT kharlampievsa dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices
AT kurochkinvp dosecharacteristicsofhighenergyneutronsforradiationdamageevaluationofsiliconsemiconductordevices