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Dose characteristics of high-energy neutrons for radiation damage evaluation of silicon semiconductor devices
Autores principales: | Alexeev, A G, Savitskaya, E N, Kharlampiev, S A, Kurochkin, V P |
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Lenguaje: | eng |
Publicado: |
1994
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/274861 |
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