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Metric characterization of random variables and random processes
The topic covered in this book is the study of metric and other close characteristics of different spaces and classes of random variables and the application of the entropy method to the investigation of properties of stochastic processes whose values, or increments, belong to given spaces. The foll...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
American Mathematical Society
2000
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2754412 |