Cargando…
Ageing of integrated circuits: causes, effects and mitigation techniques
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer International Publishing AG
2019
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2755181 |
| _version_ | 1780969583166881792 |
|---|---|
| author | Halak, Basel |
| author_facet | Halak, Basel |
| author_sort | Halak, Basel |
| collection | CERN |
| id | cern-2755181 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2019 |
| publisher | Springer International Publishing AG |
| record_format | invenio |
| spelling | cern-27551812021-04-21T16:42:43Zhttp://cds.cern.ch/record/2755181engHalak, BaselAgeing of integrated circuits: causes, effects and mitigation techniquesXXSpringer International Publishing AGoai:cds.cern.ch:27551812019 |
| spellingShingle | XX Halak, Basel Ageing of integrated circuits: causes, effects and mitigation techniques |
| title | Ageing of integrated circuits: causes, effects and mitigation techniques |
| title_full | Ageing of integrated circuits: causes, effects and mitigation techniques |
| title_fullStr | Ageing of integrated circuits: causes, effects and mitigation techniques |
| title_full_unstemmed | Ageing of integrated circuits: causes, effects and mitigation techniques |
| title_short | Ageing of integrated circuits: causes, effects and mitigation techniques |
| title_sort | ageing of integrated circuits: causes, effects and mitigation techniques |
| topic | XX |
| url | http://cds.cern.ch/record/2755181 |
| work_keys_str_mv | AT halakbasel ageingofintegratedcircuitscauseseffectsandmitigationtechniques |