Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers

Detalles Bibliográficos
Autores principales: Zhang, Zhaoxiang, Suter, David, Tian, Yingli, Branzan Albu, Alexandra, Sidère, Nicolas, Jair Escalante, Hugo
Lenguaje:eng
Publicado: Springer International Publishing AG 2018
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2755400
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author Zhang, Zhaoxiang
Suter, David
Tian, Yingli
Branzan Albu, Alexandra
Sidère, Nicolas
Jair Escalante, Hugo
author_facet Zhang, Zhaoxiang
Suter, David
Tian, Yingli
Branzan Albu, Alexandra
Sidère, Nicolas
Jair Escalante, Hugo
author_sort Zhang, Zhaoxiang
collection CERN
id cern-2755400
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
publisher Springer International Publishing AG
record_format invenio
spelling cern-27554002021-04-21T16:42:30Zhttp://cds.cern.ch/record/2755400engZhang, ZhaoxiangSuter, DavidTian, YingliBranzan Albu, AlexandraSidère, NicolasJair Escalante, HugoPattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papersXXSpringer International Publishing AGoai:cds.cern.ch:27554002018
spellingShingle XX
Zhang, Zhaoxiang
Suter, David
Tian, Yingli
Branzan Albu, Alexandra
Sidère, Nicolas
Jair Escalante, Hugo
Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers
title Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers
title_full Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers
title_fullStr Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers
title_full_unstemmed Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers
title_short Pattern recognition and information forensics: ICPR 2018 international workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised selected papers
title_sort pattern recognition and information forensics: icpr 2018 international workshops, cvaui, iwcf, and mippsna, beijing, china, august 20-24, 2018, revised selected papers
topic XX
url http://cds.cern.ch/record/2755400
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