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Progress in pattern recognition, image analysis, computer vision, and applications: 20th Iberoamerican congress, CIARP 2015, Montevideo, Uruguay, November 9-12, 2015, proceedings
Autores principales: | Pardo, Alvaro, Kittler, Josef |
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Lenguaje: | eng |
Publicado: |
Springer International Publishing AG
2015
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2757647 |
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