Cargando…
Gettering and defect engineering in semiconductor technology IV
Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991.
Autores principales: | , |
---|---|
Lenguaje: | eng |
Publicado: |
Trans Tech Publications
1991
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2758008 |
_version_ | 1780970067475824640 |
---|---|
author | Kittler, M Richter, H |
author_facet | Kittler, M Richter, H |
author_sort | Kittler, M |
collection | CERN |
description | Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991. |
id | cern-2758008 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1991 |
publisher | Trans Tech Publications |
record_format | invenio |
spelling | cern-27580082021-04-21T16:40:44Zhttp://cds.cern.ch/record/2758008engKittler, MRichter, HGettering and defect engineering in semiconductor technology IVXXProceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991.Trans Tech Publicationsoai:cds.cern.ch:27580081991 |
spellingShingle | XX Kittler, M Richter, H Gettering and defect engineering in semiconductor technology IV |
title | Gettering and defect engineering in semiconductor technology IV |
title_full | Gettering and defect engineering in semiconductor technology IV |
title_fullStr | Gettering and defect engineering in semiconductor technology IV |
title_full_unstemmed | Gettering and defect engineering in semiconductor technology IV |
title_short | Gettering and defect engineering in semiconductor technology IV |
title_sort | gettering and defect engineering in semiconductor technology iv |
topic | XX |
url | http://cds.cern.ch/record/2758008 |
work_keys_str_mv | AT kittlerm getteringanddefectengineeringinsemiconductortechnologyiv AT richterh getteringanddefectengineeringinsemiconductortechnologyiv |