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Interconnection network reliability evaluation: multistage layouts
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
John Wiley & Sons
2020
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2758115 |
_version_ | 1780970090350510080 |
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author | Goyal, Neeraj Kumar Rajkumar, S |
author_facet | Goyal, Neeraj Kumar Rajkumar, S |
author_sort | Goyal, Neeraj Kumar |
collection | CERN |
id | cern-2758115 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2020 |
publisher | John Wiley & Sons |
record_format | invenio |
spelling | cern-27581152021-04-21T16:40:39Zhttp://cds.cern.ch/record/2758115engGoyal, Neeraj KumarRajkumar, SInterconnection network reliability evaluation: multistage layoutsXXJohn Wiley & Sonsoai:cds.cern.ch:27581152020 |
spellingShingle | XX Goyal, Neeraj Kumar Rajkumar, S Interconnection network reliability evaluation: multistage layouts |
title | Interconnection network reliability evaluation: multistage layouts |
title_full | Interconnection network reliability evaluation: multistage layouts |
title_fullStr | Interconnection network reliability evaluation: multistage layouts |
title_full_unstemmed | Interconnection network reliability evaluation: multistage layouts |
title_short | Interconnection network reliability evaluation: multistage layouts |
title_sort | interconnection network reliability evaluation: multistage layouts |
topic | XX |
url | http://cds.cern.ch/record/2758115 |
work_keys_str_mv | AT goyalneerajkumar interconnectionnetworkreliabilityevaluationmultistagelayouts AT rajkumars interconnectionnetworkreliabilityevaluationmultistagelayouts |