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Interconnection network reliability evaluation: multistage layouts

Detalles Bibliográficos
Autores principales: Goyal, Neeraj Kumar, Rajkumar, S
Lenguaje:eng
Publicado: John Wiley & Sons 2020
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2758115
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author Goyal, Neeraj Kumar
Rajkumar, S
author_facet Goyal, Neeraj Kumar
Rajkumar, S
author_sort Goyal, Neeraj Kumar
collection CERN
id cern-2758115
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
publisher John Wiley & Sons
record_format invenio
spelling cern-27581152021-04-21T16:40:39Zhttp://cds.cern.ch/record/2758115engGoyal, Neeraj KumarRajkumar, SInterconnection network reliability evaluation: multistage layoutsXXJohn Wiley & Sonsoai:cds.cern.ch:27581152020
spellingShingle XX
Goyal, Neeraj Kumar
Rajkumar, S
Interconnection network reliability evaluation: multistage layouts
title Interconnection network reliability evaluation: multistage layouts
title_full Interconnection network reliability evaluation: multistage layouts
title_fullStr Interconnection network reliability evaluation: multistage layouts
title_full_unstemmed Interconnection network reliability evaluation: multistage layouts
title_short Interconnection network reliability evaluation: multistage layouts
title_sort interconnection network reliability evaluation: multistage layouts
topic XX
url http://cds.cern.ch/record/2758115
work_keys_str_mv AT goyalneerajkumar interconnectionnetworkreliabilityevaluationmultistagelayouts
AT rajkumars interconnectionnetworkreliabilityevaluationmultistagelayouts