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Verification, model checking, and abstract interpretation: 21st international conference, VMCAI 2020, New Orleans, LA, USA, January 16-21, 2020, proceedings
Autores principales: | Beyer, Dirk, Zufferey, Damien |
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Lenguaje: | eng |
Publicado: |
Springer International Publishing AG
2020
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2760742 |
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