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Ultrahigh-vacuum technology for electron microscopes
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
Elsevier Science & Technology
2020
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2760809 |
_version_ | 1780970419272024064 |
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author | Yoshimura, Nagamitsu |
author_facet | Yoshimura, Nagamitsu |
author_sort | Yoshimura, Nagamitsu |
collection | CERN |
id | cern-2760809 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2020 |
publisher | Elsevier Science & Technology |
record_format | invenio |
spelling | cern-27608092021-04-21T16:39:57Zhttp://cds.cern.ch/record/2760809engYoshimura, NagamitsuUltrahigh-vacuum technology for electron microscopesXXElsevier Science & Technologyoai:cds.cern.ch:27608092020 |
spellingShingle | XX Yoshimura, Nagamitsu Ultrahigh-vacuum technology for electron microscopes |
title | Ultrahigh-vacuum technology for electron microscopes |
title_full | Ultrahigh-vacuum technology for electron microscopes |
title_fullStr | Ultrahigh-vacuum technology for electron microscopes |
title_full_unstemmed | Ultrahigh-vacuum technology for electron microscopes |
title_short | Ultrahigh-vacuum technology for electron microscopes |
title_sort | ultrahigh-vacuum technology for electron microscopes |
topic | XX |
url | http://cds.cern.ch/record/2760809 |
work_keys_str_mv | AT yoshimuranagamitsu ultrahighvacuumtechnologyforelectronmicroscopes |