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Chaos and stability in defect processes in semiconductors

Detalles Bibliográficos
Autores principales:	Verner, I V, Gerasimenko, Nikolai N, Corbett, J W
Lenguaje:	eng
Publicado:	Trans Tech Publications 1992
Materias:	XX
Acceso en línea:	http://cds.cern.ch/record/2762257

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