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Gettering and defect engineering in semiconductor technology X
GADEST 2003 Proceedings of the 10th International Autumn Meeting on Gettering anf Defect Engineering in Semiconductor Technology, September 21-26, 2003, Brandenburg, Germany.
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Trans Tech Publications
2004
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2762301 |
_version_ | 1780970684236693504 |
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author | Richter, Hans Kittler, Martin |
author_facet | Richter, Hans Kittler, Martin |
author_sort | Richter, Hans |
collection | CERN |
description | GADEST 2003 Proceedings of the 10th International Autumn Meeting on Gettering anf Defect Engineering in Semiconductor Technology, September 21-26, 2003, Brandenburg, Germany. |
id | cern-2762301 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2004 |
publisher | Trans Tech Publications |
record_format | invenio |
spelling | cern-27623012021-04-21T16:39:09Zhttp://cds.cern.ch/record/2762301engRichter, HansKittler, MartinGettering and defect engineering in semiconductor technology XXXGADEST 2003 Proceedings of the 10th International Autumn Meeting on Gettering anf Defect Engineering in Semiconductor Technology, September 21-26, 2003, Brandenburg, Germany.Trans Tech Publicationsoai:cds.cern.ch:27623012004 |
spellingShingle | XX Richter, Hans Kittler, Martin Gettering and defect engineering in semiconductor technology X |
title | Gettering and defect engineering in semiconductor technology X |
title_full | Gettering and defect engineering in semiconductor technology X |
title_fullStr | Gettering and defect engineering in semiconductor technology X |
title_full_unstemmed | Gettering and defect engineering in semiconductor technology X |
title_short | Gettering and defect engineering in semiconductor technology X |
title_sort | gettering and defect engineering in semiconductor technology x |
topic | XX |
url | http://cds.cern.ch/record/2762301 |
work_keys_str_mv | AT richterhans getteringanddefectengineeringinsemiconductortechnologyx AT kittlermartin getteringanddefectengineeringinsemiconductortechnologyx |