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Beam injection assessment of microstructures in semiconductors
BIAMS 2000.
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Trans Tech Publications
2001
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2762385 |
| _version_ | 1780970702778662912 |
|---|---|
| author | Tomokage, H Sekiguchi, Takashi |
| author_facet | Tomokage, H Sekiguchi, Takashi |
| author_sort | Tomokage, H |
| collection | CERN |
| description | BIAMS 2000. |
| id | cern-2762385 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2001 |
| publisher | Trans Tech Publications |
| record_format | invenio |
| spelling | cern-27623852021-04-21T16:39:05Zhttp://cds.cern.ch/record/2762385engTomokage, HSekiguchi, TakashiBeam injection assessment of microstructures in semiconductorsXXBIAMS 2000.Trans Tech Publicationsoai:cds.cern.ch:27623852001 |
| spellingShingle | XX Tomokage, H Sekiguchi, Takashi Beam injection assessment of microstructures in semiconductors |
| title | Beam injection assessment of microstructures in semiconductors |
| title_full | Beam injection assessment of microstructures in semiconductors |
| title_fullStr | Beam injection assessment of microstructures in semiconductors |
| title_full_unstemmed | Beam injection assessment of microstructures in semiconductors |
| title_short | Beam injection assessment of microstructures in semiconductors |
| title_sort | beam injection assessment of microstructures in semiconductors |
| topic | XX |
| url | http://cds.cern.ch/record/2762385 |
| work_keys_str_mv | AT tomokageh beaminjectionassessmentofmicrostructuresinsemiconductors AT sekiguchitakashi beaminjectionassessmentofmicrostructuresinsemiconductors |