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Advances in biometrics: international conference, ICB 2007, Seoul, Korea, August 27-29, 2007, proceedings
Autores principales: | Lee, Seong-Whan, Li, Stan Z |
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Lenguaje: | eng |
Publicado: |
Springer
2007
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2762892 |
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