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New (TH)GEM coating materials characterized using spectroscopy methods

In this work GEM and single-hole Thick GEM structures, composed of different coating materials, are studied. The used foils incorporate conductive layers made of copper, aluminium, molybdenum, stainless steel, tungsten and tantalum. The main focus of the study is the determination of the material de...

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Autores principales: Ulukutlu, B., Gasik, P., Waldmann, T., Fabbietti, L., Klemenz, T., Lautner, L., de Oliveira, R., Williams, S.
Lenguaje:eng
Publicado: 2021
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2021.165829
http://cds.cern.ch/record/2765355
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author Ulukutlu, B.
Gasik, P.
Waldmann, T.
Fabbietti, L.
Klemenz, T.
Lautner, L.
de Oliveira, R.
Williams, S.
author_facet Ulukutlu, B.
Gasik, P.
Waldmann, T.
Fabbietti, L.
Klemenz, T.
Lautner, L.
de Oliveira, R.
Williams, S.
author_sort Ulukutlu, B.
collection CERN
description In this work GEM and single-hole Thick GEM structures, composed of different coating materials, are studied. The used foils incorporate conductive layers made of copper, aluminium, molybdenum, stainless steel, tungsten and tantalum. The main focus of the study is the determination of the material dependence of the formation of electrical discharges in GEM-based detectors. For this task, discharge probability measurements are conducted with several Thick GEM samples using a basic electronics readout chain. In addition to that, optical spectroscopy methods are employed to study the light emitted during discharges from the different foils. It is observed that the light spectra of GEMs include emission lines from the conductive layer material. This indicates the presence of the foil material in the discharge plasma after the initial spark. However, no lines associated with the coating material are observed while studying spark discharges induced in Thick GEMs. It is concluded that the conductive layer material does not play a substantial role in terms of stability against primary discharges. However, a strong material dependence is observed in the case of secondary discharge formation, pointing to molybdenum coating as the one providing increased stability.
id cern-2765355
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2021
record_format invenio
spelling cern-27653552023-03-12T04:56:03Zdoi:10.1016/j.nima.2021.165829http://cds.cern.ch/record/2765355engUlukutlu, B.Gasik, P.Waldmann, T.Fabbietti, L.Klemenz, T.Lautner, L.de Oliveira, R.Williams, S.New (TH)GEM coating materials characterized using spectroscopy methodsphysics.ins-detDetectors and Experimental TechniquesIn this work GEM and single-hole Thick GEM structures, composed of different coating materials, are studied. The used foils incorporate conductive layers made of copper, aluminium, molybdenum, stainless steel, tungsten and tantalum. The main focus of the study is the determination of the material dependence of the formation of electrical discharges in GEM-based detectors. For this task, discharge probability measurements are conducted with several Thick GEM samples using a basic electronics readout chain. In addition to that, optical spectroscopy methods are employed to study the light emitted during discharges from the different foils. It is observed that the light spectra of GEMs include emission lines from the conductive layer material. This indicates the presence of the foil material in the discharge plasma after the initial spark. However, no lines associated with the coating material are observed while studying spark discharges induced in Thick GEMs. It is concluded that the conductive layer material does not play a substantial role in terms of stability against primary discharges. However, a strong material dependence is observed in the case of secondary discharge formation, pointing to molybdenum coating as the one providing increased stability.In this work GEM and single-hole Thick GEM structures, composed of different coating materials, are studied. The used foils incorporate conductive layers made of copper, aluminium, molybdenum, stainless steel, tungsten and tantalum. The main focus of the study is the determination of the material dependence of the formation of electrical discharges in GEM-based detectors. For this task, discharge probability measurements are conducted with several Thick GEM samples using a basic electronics readout chain. In addition to that, optical spectroscopy methods are employed to study the light emitted during discharges from the different foils. It is observed that the light spectra of GEMs include emission lines from the conductive layer material. This indicates the presence of the foil material in the discharge plasma after the initial spark. However, no lines associated with the coating material are observed while studying spark discharges induced in Thick GEMs. It is concluded that the conductive layer material does not play a substantial role in terms of stability against primary discharges. However, a strong material dependence is observed in the case of secondary discharge formation, pointing to molybdenum coating as the one providing increased stability.arXiv:2104.12191oai:cds.cern.ch:27653552021-04-25
spellingShingle physics.ins-det
Detectors and Experimental Techniques
Ulukutlu, B.
Gasik, P.
Waldmann, T.
Fabbietti, L.
Klemenz, T.
Lautner, L.
de Oliveira, R.
Williams, S.
New (TH)GEM coating materials characterized using spectroscopy methods
title New (TH)GEM coating materials characterized using spectroscopy methods
title_full New (TH)GEM coating materials characterized using spectroscopy methods
title_fullStr New (TH)GEM coating materials characterized using spectroscopy methods
title_full_unstemmed New (TH)GEM coating materials characterized using spectroscopy methods
title_short New (TH)GEM coating materials characterized using spectroscopy methods
title_sort new (th)gem coating materials characterized using spectroscopy methods
topic physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2021.165829
http://cds.cern.ch/record/2765355
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AT fabbiettil newthgemcoatingmaterialscharacterizedusingspectroscopymethods
AT klemenzt newthgemcoatingmaterialscharacterizedusingspectroscopymethods
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AT deoliveirar newthgemcoatingmaterialscharacterizedusingspectroscopymethods
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