RD53 Wafer Testing for the ATLAS ITk Pixel Detector

RD53 is the research and development group at CERN, responsible for developing and producing the next generation of readout chips for the ATLAS and CMS pixel detector upgrades at the HL-LHC. Its most recent development ITkPix is the first full-scale 65 nm hybrid pixel-detector. ITkPix consists of more than one billion transistors with a high triplication ratio in order to cope with the high particle and therefore radiation density at the heart of ATLAS. The chips will be located as close as possible to the interaction point to optimize impact parameter resolution. The ITkPix chip features a 5Gbit connection, with special data compression to deal with high hit intensities. In addition to that, a low power, low noise analog front-end is used, to ensure high readout speeds and low detection thresholds. A failure of chips at the heart of ATLAS is problematic. Therefore, thorough testing before and duringtheproduction phase is necessary. For thispurpose, Bonn has developed bdaq, a fast and versatile simulation, testing and analysis environment, making small-and large-scale testing for ITkPix and its successors possible. This talk will give an overview over the testing environment, while focusing on large scale wafer testing results to evaluatetheITkPix fitness for its deployment at the HL-LHC.