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Damage induced by pions in silicon detectors

Detalles Bibliográficos
Autores principales:	Bates, S, Furetta, C, Glaser, M, Lemeilleur, F, Soave, C, León-Florián, E
Lenguaje:	eng
Publicado:	1995
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/277238

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