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A generalized fitting tool for analysis of two-dimensional channeling patterns

The acquisition of two-dimensional (2D) channeling patterns is gaining increased popularity within the ion beam community. However, with the exception of emission channeling experiments for the lattice location of radioactive impurities, quantitative analysis of such patterns is rarely found. We pre...

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Detalles Bibliográficos
Autores principales: David-Bosne, E, Wahl, U, Correia, J G, Lima, T A L, Vantomme, A, Pereira, L M C
Lenguaje:eng
Publicado: 2020
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nimb.2019.10.029
http://cds.cern.ch/record/2778386