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Single Event Upset evaluations of CBC readout chips

The CMS Binary Chip (CBC) is a front-end ASIC to be used by the CMS tracker following its upgrade for High Luminosity LHC operation. It will instrument special silicon microstrip detectors to identify high transverse momentum particles in real time so tracking data can be used in the L1 trigger....

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Detalles Bibliográficos
Autores principales: Hall, Geoffrey, Borg, Johan, Uchida, Kirika, Jones, Lawrence, Prydderch, Mark Lyndon
Lenguaje:eng
Publicado: 2020
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2020.164416
http://cds.cern.ch/record/2780128
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author Hall, Geoffrey
Borg, Johan
Uchida, Kirika
Jones, Lawrence
Prydderch, Mark Lyndon
author_facet Hall, Geoffrey
Borg, Johan
Uchida, Kirika
Jones, Lawrence
Prydderch, Mark Lyndon
author_sort Hall, Geoffrey
collection CERN
description The CMS Binary Chip (CBC) is a front-end ASIC to be used by the CMS tracker following its upgrade for High Luminosity LHC operation. It will instrument special silicon microstrip detectors to identify high transverse momentum particles in real time so tracking data can be used in the L1 trigger. The CBC should be robust against Single Event Upsets (SEUs). SEU rates have been measured in a series of tests in a 62 MeV proton beam. Each version of the chip has increased the digital circuitry, and hence the SEU susceptibility, and has also been subject to design improvements which affect SEU tolerance. The relevant design features are explained and SEU measurements reported. The expected SEU rates at the HL-LHC are estimated.
id cern-2780128
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
record_format invenio
spelling cern-27801282022-01-17T14:19:32Zdoi:10.1016/j.nima.2020.164416http://cds.cern.ch/record/2780128engHall, GeoffreyBorg, JohanUchida, KirikaJones, LawrencePrydderch, Mark LyndonSingle Event Upset evaluations of CBC readout chipsDetectors and Experimental TechniquesThe CMS Binary Chip (CBC) is a front-end ASIC to be used by the CMS tracker following its upgrade for High Luminosity LHC operation. It will instrument special silicon microstrip detectors to identify high transverse momentum particles in real time so tracking data can be used in the L1 trigger. The CBC should be robust against Single Event Upsets (SEUs). SEU rates have been measured in a series of tests in a 62 MeV proton beam. Each version of the chip has increased the digital circuitry, and hence the SEU susceptibility, and has also been subject to design improvements which affect SEU tolerance. The relevant design features are explained and SEU measurements reported. The expected SEU rates at the HL-LHC are estimated.CMS-CR-2020-024oai:cds.cern.ch:27801282020-01-29
spellingShingle Detectors and Experimental Techniques
Hall, Geoffrey
Borg, Johan
Uchida, Kirika
Jones, Lawrence
Prydderch, Mark Lyndon
Single Event Upset evaluations of CBC readout chips
title Single Event Upset evaluations of CBC readout chips
title_full Single Event Upset evaluations of CBC readout chips
title_fullStr Single Event Upset evaluations of CBC readout chips
title_full_unstemmed Single Event Upset evaluations of CBC readout chips
title_short Single Event Upset evaluations of CBC readout chips
title_sort single event upset evaluations of cbc readout chips
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2020.164416
http://cds.cern.ch/record/2780128
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AT borgjohan singleeventupsetevaluationsofcbcreadoutchips
AT uchidakirika singleeventupsetevaluationsofcbcreadoutchips
AT joneslawrence singleeventupsetevaluationsofcbcreadoutchips
AT prydderchmarklyndon singleeventupsetevaluationsofcbcreadoutchips