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The lpGBT production testing system
<!--HTML-->The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of fu...
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
2021
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2782893 |
Sumario: | <!--HTML-->The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of functionalities which will be validated at three different power-supply voltages, two temperatures and over more than 1000 parameters. As more than 175 000 chips will be produced, optimizing the test duration is also a strong requirement. In this talk, an overview of the lpGBT v1 production test system will be given, challenges will be presented, and performance will be discussed. |
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