The lpGBT production testing system

<!--HTML-->The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of fu...

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Detalles Bibliográficos
Autor principal: Guettouche, Nour El Houda
Lenguaje:eng
Publicado: 2021
Materias:
Conferences
Acceso en línea:http://cds.cern.ch/record/2782893
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author Guettouche, Nour El Houda
author_facet Guettouche, Nour El Houda
author_sort Guettouche, Nour El Houda
collection CERN
description <!--HTML-->The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of functionalities which will be validated at three different power-supply voltages, two temperatures and over more than 1000 parameters. As more than 175 000 chips will be produced, optimizing the test duration is also a strong requirement. In this talk, an overview of the lpGBT v1 production test system will be given, challenges will be presented, and performance will be discussed.
id cern-2782893
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2021
record_format invenio
spelling cern-27828932022-11-02T22:02:13Zhttp://cds.cern.ch/record/2782893engGuettouche, Nour El HoudaThe lpGBT production testing systemTWEPP 2021 Topical Workshop on Electronics for Particle PhysicsConferences<!--HTML-->The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of functionalities which will be validated at three different power-supply voltages, two temperatures and over more than 1000 parameters. As more than 175 000 chips will be produced, optimizing the test duration is also a strong requirement. In this talk, an overview of the lpGBT v1 production test system will be given, challenges will be presented, and performance will be discussed.oai:cds.cern.ch:27828932021
spellingShingle Conferences
Guettouche, Nour El Houda
The lpGBT production testing system
title The lpGBT production testing system
title_full The lpGBT production testing system
title_fullStr The lpGBT production testing system
title_full_unstemmed The lpGBT production testing system
title_short The lpGBT production testing system
title_sort lpgbt production testing system
topic Conferences
url http://cds.cern.ch/record/2782893
work_keys_str_mv AT guettouchenourelhouda thelpgbtproductiontestingsystem
AT guettouchenourelhouda twepp2021topicalworkshoponelectronicsforparticlephysics
AT guettouchenourelhouda lpgbtproductiontestingsystem

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