Neutron beam test of fanout and clock jitter cleaner microchips for the ATLAS Muon New Small Wheel

This report summarizes a neutron beam test of two microchips proposed for use in the ATLAS Muon system Phase 1 upgrade electronics. These chips are the 1) SY54020AR clock fan-out/buffer produced by the Microchip Co. and and 2) the Si5344 jitter cleaner produced by Silicon Labs. The experimental objective was to determine the Single Event Upset (SEU ) failure modes and rates under conditions expected in the ATLAS Muon Spectrometer New Small Wheel inner rim region. The experiment was conducted at the LANSCE WNR facility at Los Alamos, NM and yielded a total fluence of 2.49E11 n/cm^2 over 83 hours. The fanout/buffer chips registered a total of 0.075 errors and the jitter cleaner registered a hard error rate of 0.36 faults, each per per week of equivalent ATLAS HL-LHC at the NSW inner rim region.