Metal-insulator transition in crystalline V$_2$O$_3$ thin films probed at atomic-scale using emission Mössbauer spectroscopy

Microscopic understanding the metal-to-insulator transition (MIT) in strongly correlated materials is critical to the design and control of modern “beyond silicon” Mott nanodevices. In this work, the local MIT behaviors in single crystalline V$_2$O$_3$ thin films were probed on an atomic scale by on...

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Detalles Bibliográficos
Autores principales: Qi, B, Gunnlaugsson, H P, Ólafsson, S, Gislason, H P, Thorsteinsson, E B, Arnalds, U B, Mantovan, R, Unzueta l, I, Zyabkin, D V, Bharuth Ram, K, Johnston, K, Krastev, P B, Mølholt, T E, Masenda, H, Tarazaga Martín-Luengo, A, Naidoo, D, Schell, J
Lenguaje:eng
Publicado: 2020
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.tsf.2020.138389
http://cds.cern.ch/record/2800453

Internet

https://dx.doi.org/10.1016/j.tsf.2020.138389
http://cds.cern.ch/record/2800453

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