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Multiple scattering of channeled and non-channeled positively charged particles in bent monocrystalline silicon

We present the results of an experimental study of multiple scattering of positively charged high-energy particles in bent samples of monocrystalline silicon. This work confirms the recently discovered effect of a strong reduction in the rms multiple scattering angle of particles channeled in the si...

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Detalles Bibliográficos
Autores principales: Scandale, W., Arduini, G., Cerutti, F., Esposito, L.S., Garattini, M., Gilardoni, S., Losito, R., Masi, A., Mirarchi, D., Montesano, S., Redaelli, S., Rossi, R., Smirnov, G., Burmistrov, L., Dubos, S., Puill, V., Stocchi, A., Bandiera, L., Guidi, V., Mazzolari, A., Romangnoni, M., Murtas, F., Addesa, F.M., Cavoto, G., Iacoangeli, F., Galluccio, F., Afonin, A.G., Chesnokov, Yu. A., Durum, A.A., Maisheev, V.A., Sandomirskiy, Yu. E., Yanovich, A.A., Kovalenko, A.D., Taratin, A.M., Denisov, A.S., Gavrikov, Yu. A., Ivanov, Yu. M., Malyarenko, L.G., Borg, J., James, T., Hall, G., Pesaresi, M.
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:https://dx.doi.org/10.1140/epjp/s13360-022-03034-6
http://cds.cern.ch/record/2801248

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