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High accuracy, high resolution $^{235}$U(n,f) cross section from n_TOF (CERN) from 18 meV to 10 keV

The $^{235}$U(n,f) cross section was measured in a wide energy range (18 meV–170 keV) at the n_TOF facility at CERN, relative to $^{6}$Li(n,t) and $^{10}$B(n,α) standard reactions, with high resolution and accuracy, with a setup based on a stack of six samples and six silicon detectors placed in the...

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Detalles Bibliográficos
Autores principales: Mastromarco, M., Amaducci, S., Colonna, N., Finocchiaro, P., Cosentino, L., Barbagallo, M., Aberle, O., Andrzejewski, J., Audouin, L., Bacak, M., Balibrea, J., Bečvář, F., Berthoumieux, E., Billowes, J., Bosnar, D., Brown, A., Caamaño, M., Calviño, F., Calviani, M., Cano-Ott, D., Cardella, R., Casanovas, A., Cerutti, F., Chen, Y.H., Chiaveri, E., Cortés, G., Cortés-Giraldo, M.A., Damone, L.A., Diakaki, M., Domingo-Pardo, C., Diacono, D., Dressler, R., Dupont, E., Durán, I., Fernández-Domínguez, B., Ferrari, A., Ferreira, P., Furman, V., Göbel, K., García, A.R., Gawlik, A., Gilardoni, S., Glodariu, T., Gonçalves, I.F., González-Romero, E., Griesmayer, E., Guerrero, C., Gunsing, F., Harada, H., Heinitz, S., Heyse, J., Jenkins, D.G., Jericha, E., Käppeler, F., Kadi, Y., Kalamara, A., Kavrigin, P., Kimura, A., Kivel, N., Knapova, I., Kokkoris, M., Krtička, M., Kurtulgil, D., Leal-Cidoncha, E., Lederer, C., Leeb, H., Lerendegui-Marco, J., Meo, S. Lo, Lonsdale, S.J., Macina, D., Manna, A., Marganiec, J., Martínez, T., Masi, A., Massimi, C., Mastinu, P., Maugeri, E.A., Mazzone, A., Mendoza, E., Mengoni, A., Milazzo, P.M., Mingrone, F., Musumarra, A., Negret, A., Nolte, R., Oprea, A., Patronis, N., Pavlik, A., Perkowski, J., Porras, I., Praena, J., Quesada, J.M., Radeck, D., Rauscher, T., Reifarth, R., Rubbia, C., Ryan, J.A., Sabaté-Gilarte, M., Saxena, A., Schillebeeckx, P., Schumann, D., Sedyshev, P., Smith, A.G., Sosnin, N.V., Stamatopoulos, A., Tagliente, G., Tain, J.L., Tarifeño-Saldivia, A., Tassan-Got, L., Valenta, S., Vannini, G., Variale, V., Vaz, P., Ventura, A., Vlachoudis, V., Vlastou, R., Wallner, A., Warren, S., Weiss, C., Woods, P.J., Wright, T., Žugec, P.
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:https://dx.doi.org/10.1140/epja/s10050-022-00779-7
http://cds.cern.ch/record/2801459

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