Direct detection of charged particles with SiPMs

The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in a systematic way for the first time. Using beam test data, time resolution and the crosstalk probability have been measured. A characterization of the SiPM by means of a laser beam is a...

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Detalles Bibliográficos
Autores principales: Carnesecchi, F., Vignola, G., Agrawal, N., Alici, A., Antonioli, P., Arcelli, S., Bellini, F., Cavazza, D., Cifarelli, L., Colocci, M., Durando, S., Ercolessi, F., Garbini, M., Giacalone, M., Hatzifotiadou, D., Jacazio, N., Margotti, A., Malfattore, G., Nania, R., Noferini, F., Pinazza, O., Preghenella, R., Ricci, R., Rignanese, L., Rubini, N., Scapparone, E., Scioli, G., Strazzi, S., Tripathy, S., Zichichi, A.
Lenguaje:eng
Publicado: 2022
Materias:
hep-ex
Particle Physics - Experiment
physics.ins-det
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/17/06/P06007
http://cds.cern.ch/record/2802353

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