Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of...

Descripción completa

Detalles Bibliográficos
Autores principales: Luza, Lucas Matana, Soderstrom, Daniel, Puchner, Helmut, Alia, Ruben Garcia, Letiche, Manon, Bosio, Alberto, Dilillo, Luigi
Lenguaje:eng
Publicado: 2020
Materias:
Nuclear Physics - Experiment
Acceso en línea:https://dx.doi.org/10.1109/dtis48698.2020.9080918
http://cds.cern.ch/record/2807280
_version_ 1780973045312126976
author Luza, Lucas Matana
Soderstrom, Daniel
Puchner, Helmut
Alia, Ruben Garcia
Letiche, Manon
Bosio, Alberto
Dilillo, Luigi
author_facet Luza, Lucas Matana
Soderstrom, Daniel
Puchner, Helmut
Alia, Ruben Garcia
Letiche, Manon
Bosio, Alberto
Dilillo, Luigi
author_sort Luza, Lucas Matana
collection CERN
description In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and singlebit upsets.
id cern-2807280
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
record_format invenio
spelling cern-28072802022-04-22T21:58:56Zdoi:10.1109/dtis48698.2020.9080918http://cds.cern.ch/record/2807280engLuza, Lucas MatanaSoderstrom, DanielPuchner, HelmutAlia, Ruben GarciaLetiche, ManonBosio, AlbertoDilillo, LuigiEffects of Thermal Neutron Irradiation on a Self-Refresh DRAMNuclear Physics - ExperimentIn this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and singlebit upsets.oai:cds.cern.ch:28072802020
spellingShingle Nuclear Physics - Experiment
Luza, Lucas Matana
Soderstrom, Daniel
Puchner, Helmut
Alia, Ruben Garcia
Letiche, Manon
Bosio, Alberto
Dilillo, Luigi
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
title Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
title_full Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
title_fullStr Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
title_full_unstemmed Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
title_short Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
title_sort effects of thermal neutron irradiation on a self-refresh dram
topic Nuclear Physics - Experiment
url https://dx.doi.org/10.1109/dtis48698.2020.9080918
http://cds.cern.ch/record/2807280
work_keys_str_mv AT luzalucasmatana effectsofthermalneutronirradiationonaselfrefreshdram
AT soderstromdaniel effectsofthermalneutronirradiationonaselfrefreshdram
AT puchnerhelmut effectsofthermalneutronirradiationonaselfrefreshdram
AT aliarubengarcia effectsofthermalneutronirradiationonaselfrefreshdram
AT letichemanon effectsofthermalneutronirradiationonaselfrefreshdram
AT bosioalberto effectsofthermalneutronirradiationonaselfrefreshdram
AT dililloluigi effectsofthermalneutronirradiationonaselfrefreshdram

Ejemplares similares