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Automated visual inspection of silicon detectors in CMS experiment

In the CMS experiment at CERN, Geneva, a large number of HGCAL sensor modules are fabricated in advanced laboratories around the world. Each sensor module contains about 700 checkpoints for visual inspection thus making it almost impossible to carry out such inspection manually. As artificial intell...

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Detalles Bibliográficos
Autores principales: Giri, Nupur, Dugad, Shashi, Chhabria, Amit, Manwani, Rashmi, Asrani, Priyanka
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:http://cds.cern.ch/record/2812137
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author Giri, Nupur
Dugad, Shashi
Chhabria, Amit
Manwani, Rashmi
Asrani, Priyanka
author_facet Giri, Nupur
Dugad, Shashi
Chhabria, Amit
Manwani, Rashmi
Asrani, Priyanka
author_sort Giri, Nupur
collection CERN
description In the CMS experiment at CERN, Geneva, a large number of HGCAL sensor modules are fabricated in advanced laboratories around the world. Each sensor module contains about 700 checkpoints for visual inspection thus making it almost impossible to carry out such inspection manually. As artificial intelligence is more and more widely used in manufacturing, traditional detection technologies are gradually being intelligent. In order to more accurately evaluate the checkpoints, we propose to use deep learning-based object detection techniques to detect manufacturing defects in testing large numbers of modules automatically.
id cern-2812137
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2022
record_format invenio
spelling cern-28121372023-06-28T03:48:20Zhttp://cds.cern.ch/record/2812137engGiri, NupurDugad, ShashiChhabria, AmitManwani, RashmiAsrani, PriyankaAutomated visual inspection of silicon detectors in CMS experimentcs.LGComputing and Computersphysics.ins-detDetectors and Experimental TechniquesIn the CMS experiment at CERN, Geneva, a large number of HGCAL sensor modules are fabricated in advanced laboratories around the world. Each sensor module contains about 700 checkpoints for visual inspection thus making it almost impossible to carry out such inspection manually. As artificial intelligence is more and more widely used in manufacturing, traditional detection technologies are gradually being intelligent. In order to more accurately evaluate the checkpoints, we propose to use deep learning-based object detection techniques to detect manufacturing defects in testing large numbers of modules automatically.arXiv:2206.02572oai:cds.cern.ch:28121372022-06-03
spellingShingle cs.LG
Computing and Computers
physics.ins-det
Detectors and Experimental Techniques
Giri, Nupur
Dugad, Shashi
Chhabria, Amit
Manwani, Rashmi
Asrani, Priyanka
Automated visual inspection of silicon detectors in CMS experiment
title Automated visual inspection of silicon detectors in CMS experiment
title_full Automated visual inspection of silicon detectors in CMS experiment
title_fullStr Automated visual inspection of silicon detectors in CMS experiment
title_full_unstemmed Automated visual inspection of silicon detectors in CMS experiment
title_short Automated visual inspection of silicon detectors in CMS experiment
title_sort automated visual inspection of silicon detectors in cms experiment
topic cs.LG
Computing and Computers
physics.ins-det
Detectors and Experimental Techniques
url http://cds.cern.ch/record/2812137
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AT dugadshashi automatedvisualinspectionofsilicondetectorsincmsexperiment
AT chhabriaamit automatedvisualinspectionofsilicondetectorsincmsexperiment
AT manwanirashmi automatedvisualinspectionofsilicondetectorsincmsexperiment
AT asranipriyanka automatedvisualinspectionofsilicondetectorsincmsexperiment