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FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits
When studying the behavior of a field programmable gate array (FPGA) under radiation, the most commonly used methodology consists in evaluating the single-event effect (SEE) cross section of its elements individually. However, this method does not allow the estimation of the device failure rate when...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2022
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2022.3162037 http://cds.cern.ch/record/2823941 |