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Study, implementation and testing of radiation tolerant design for testability solutions for CMS OT FE ASICs

The MPA and SSA development is approaching the production phase with an approximate volume of more than 200k ASICs, corresponding to 1200 wafers. The limited manufacturing yield requires testing strategies able to identify defective units and guarantee the correct functionality of the tracker module...

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Detalles Bibliográficos
Autores principales: Bergamin, G, Caratelli, A, Ceresa, D, Kloukinas, K, Scarfì, S, Nookala, A
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/17/04/C04009
http://cds.cern.ch/record/2823957

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