Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications

In search of alternative solutions for Field Programmable Gate Arrays (FPGA) that can withstand the higher dose levels foreseen in the upcoming upgrades of the Large Hadron Collider (LHC), a new Radiation Hardened FPGA is targeted. More specifically, in this work, the effects of proton induced radia...

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Autores principales: Tsiligiannis, G, Debarge, C, Le Mauff, J, Masi, A, Danzeca, S
Lenguaje:eng
Publicado: 2019
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/radecs47380.2019.9745713
http://cds.cern.ch/record/2823959
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author Tsiligiannis, G
Debarge, C
Le Mauff, J
Masi, A
Danzeca, S
author_facet Tsiligiannis, G
Debarge, C
Le Mauff, J
Masi, A
Danzeca, S
author_sort Tsiligiannis, G
collection CERN
description In search of alternative solutions for Field Programmable Gate Arrays (FPGA) that can withstand the higher dose levels foreseen in the upcoming upgrades of the Large Hadron Collider (LHC), a new Radiation Hardened FPGA is targeted. More specifically, in this work, the effects of proton induced radiation on a 65nm Rad Hard SRAM-Based FPGA are investigated, while applying tailored tests for each resource of the FPGA. The results of the study are then used to perform a Reliability analysis of this device, adapted to the CERN radiation environment while using standard models.
id cern-2823959
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2019
record_format invenio
spelling cern-28239592022-08-09T14:15:39Zdoi:10.1109/radecs47380.2019.9745713http://cds.cern.ch/record/2823959engTsiligiannis, GDebarge, CLe Mauff, JMasi, ADanzeca, SReliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applicationsDetectors and Experimental TechniquesIn search of alternative solutions for Field Programmable Gate Arrays (FPGA) that can withstand the higher dose levels foreseen in the upcoming upgrades of the Large Hadron Collider (LHC), a new Radiation Hardened FPGA is targeted. More specifically, in this work, the effects of proton induced radiation on a 65nm Rad Hard SRAM-Based FPGA are investigated, while applying tailored tests for each resource of the FPGA. The results of the study are then used to perform a Reliability analysis of this device, adapted to the CERN radiation environment while using standard models.oai:cds.cern.ch:28239592019
spellingShingle Detectors and Experimental Techniques
Tsiligiannis, G
Debarge, C
Le Mauff, J
Masi, A
Danzeca, S
Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
title Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
title_full Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
title_fullStr Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
title_full_unstemmed Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
title_short Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications
title_sort reliability analysis of a 65nm rad-hard sram-based fpga for cern applications
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/radecs47380.2019.9745713
http://cds.cern.ch/record/2823959
work_keys_str_mv AT tsiligiannisg reliabilityanalysisofa65nmradhardsrambasedfpgaforcernapplications
AT debargec reliabilityanalysisofa65nmradhardsrambasedfpgaforcernapplications
AT lemauffj reliabilityanalysisofa65nmradhardsrambasedfpgaforcernapplications
AT masia reliabilityanalysisofa65nmradhardsrambasedfpgaforcernapplications
AT danzecas reliabilityanalysisofa65nmradhardsrambasedfpgaforcernapplications

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