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Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors

The interpretation of the spectra recorded by the Thermally Stimulated Current technique (TSC) is accompanied by using pytsc, a python-based software developed by Nuria Castello-Mor and Isidre Mateau which helps to simulate TSC scans using data recorded by other defect characterization procedures. H...

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Autor principal: Peters, Karol Pawel
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:http://cds.cern.ch/record/2826487
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author Peters, Karol Pawel
author_facet Peters, Karol Pawel
author_sort Peters, Karol Pawel
collection CERN
description The interpretation of the spectra recorded by the Thermally Stimulated Current technique (TSC) is accompanied by using pytsc, a python-based software developed by Nuria Castello-Mor and Isidre Mateau which helps to simulate TSC scans using data recorded by other defect characterization procedures. However, the software comprised bugs which lead the simulation to be not consistent with real data. Therefore, the main objective of the Summer Student project was to solve this problem and enhance pytsc by new features. This report is a documentation of the changes made which contribute to the easy use of pytsc. Furthermore, it demonstrates the successful simulation of TSC data using data extracted from Deep-Level-Transient Spectroscopy (DLTS) measurements. The simulations provide new insights in the defect nature and give a thought-provoking impulse for future attempts at defect characterization
id cern-2826487
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2022
record_format invenio
spelling cern-28264872022-09-07T18:33:17Zhttp://cds.cern.ch/record/2826487engPeters, Karol PawelDevelopment and application of analysis software for a current based defect characterization technique in irradiated silicon sensorsComputing and ComputersThe interpretation of the spectra recorded by the Thermally Stimulated Current technique (TSC) is accompanied by using pytsc, a python-based software developed by Nuria Castello-Mor and Isidre Mateau which helps to simulate TSC scans using data recorded by other defect characterization procedures. However, the software comprised bugs which lead the simulation to be not consistent with real data. Therefore, the main objective of the Summer Student project was to solve this problem and enhance pytsc by new features. This report is a documentation of the changes made which contribute to the easy use of pytsc. Furthermore, it demonstrates the successful simulation of TSC data using data extracted from Deep-Level-Transient Spectroscopy (DLTS) measurements. The simulations provide new insights in the defect nature and give a thought-provoking impulse for future attempts at defect characterizationCERN-STUDENTS-Note-2022-126oai:cds.cern.ch:28264872022-09-07
spellingShingle Computing and Computers
Peters, Karol Pawel
Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
title Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
title_full Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
title_fullStr Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
title_full_unstemmed Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
title_short Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
title_sort development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
topic Computing and Computers
url http://cds.cern.ch/record/2826487
work_keys_str_mv AT peterskarolpawel developmentandapplicationofanalysissoftwareforacurrentbaseddefectcharacterizationtechniqueinirradiatedsiliconsensors