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Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors
The interpretation of the spectra recorded by the Thermally Stimulated Current technique (TSC) is accompanied by using pytsc, a python-based software developed by Nuria Castello-Mor and Isidre Mateau which helps to simulate TSC scans using data recorded by other defect characterization procedures. H...
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Lenguaje: | eng |
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2022
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Acceso en línea: | http://cds.cern.ch/record/2826487 |
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author | Peters, Karol Pawel |
author_facet | Peters, Karol Pawel |
author_sort | Peters, Karol Pawel |
collection | CERN |
description | The interpretation of the spectra recorded by the Thermally Stimulated Current technique (TSC) is accompanied by using pytsc, a python-based software developed by Nuria Castello-Mor and Isidre Mateau which helps to simulate TSC scans using data recorded by other defect characterization procedures. However, the software comprised bugs which lead the simulation to be not consistent with real data. Therefore, the main objective of the Summer Student project was to solve this problem and enhance pytsc by new features. This report is a documentation of the changes made which contribute to the easy use of pytsc. Furthermore, it demonstrates the successful simulation of TSC data using data extracted from Deep-Level-Transient Spectroscopy (DLTS) measurements. The simulations provide new insights in the defect nature and give a thought-provoking impulse for future attempts at defect characterization |
id | cern-2826487 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2022 |
record_format | invenio |
spelling | cern-28264872022-09-07T18:33:17Zhttp://cds.cern.ch/record/2826487engPeters, Karol PawelDevelopment and application of analysis software for a current based defect characterization technique in irradiated silicon sensorsComputing and ComputersThe interpretation of the spectra recorded by the Thermally Stimulated Current technique (TSC) is accompanied by using pytsc, a python-based software developed by Nuria Castello-Mor and Isidre Mateau which helps to simulate TSC scans using data recorded by other defect characterization procedures. However, the software comprised bugs which lead the simulation to be not consistent with real data. Therefore, the main objective of the Summer Student project was to solve this problem and enhance pytsc by new features. This report is a documentation of the changes made which contribute to the easy use of pytsc. Furthermore, it demonstrates the successful simulation of TSC data using data extracted from Deep-Level-Transient Spectroscopy (DLTS) measurements. The simulations provide new insights in the defect nature and give a thought-provoking impulse for future attempts at defect characterizationCERN-STUDENTS-Note-2022-126oai:cds.cern.ch:28264872022-09-07 |
spellingShingle | Computing and Computers Peters, Karol Pawel Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
title | Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
title_full | Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
title_fullStr | Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
title_full_unstemmed | Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
title_short | Development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
title_sort | development and application of analysis software for a current based defect characterization technique in irradiated silicon sensors |
topic | Computing and Computers |
url | http://cds.cern.ch/record/2826487 |
work_keys_str_mv | AT peterskarolpawel developmentandapplicationofanalysissoftwareforacurrentbaseddefectcharacterizationtechniqueinirradiatedsiliconsensors |