Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit

Detalles Bibliográficos
Autor principal: Dertinger, H
Lenguaje:eng
Publicado: 1963
Materias:
Accelerators and Storage Rings
Acceso en línea:http://cds.cern.ch/record/2830488
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author Dertinger, H
author_facet Dertinger, H
author_sort Dertinger, H
collection CERN
id cern-2830488
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1963
record_format invenio
spelling cern-28304882023-10-23T10:37:49Zhttp://cds.cern.ch/record/2830488engDertinger, HMeasurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuitAccelerators and Storage RingsCERN-MPS-Int-RF-63-1MPS-Int-RF-63-1oai:cds.cern.ch:28304881963-01-23
spellingShingle Accelerators and Storage Rings
Dertinger, H
Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit
title Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit
title_full Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit
title_fullStr Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit
title_full_unstemmed Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit
title_short Measurement of dynamic transistor characteristics between 0,3 and 30 Mc/s in common emitter circuit
title_sort measurement of dynamic transistor characteristics between 0,3 and 30 mc/s in common emitter circuit
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/2830488
work_keys_str_mv AT dertingerh measurementofdynamictransistorcharacteristicsbetween03and30mcsincommonemittercircuit

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