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Transverse profile monitor using ion probe beams
Autores principales: | Bosser, J, Dimopoulou, C, Feschenko, A, Maccaferri, R |
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Lenguaje: | eng |
Publicado: |
2000
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2833086 |
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