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ALICE - ITS3 — A bent, wafer-scale CMOS detector

ALICE is developing the ITS3 (inner tracker system) as upgrade of the inner layers of the presently installed ITS with the aim to improve the pointing resolution by factor of two and to lower the material budget to an unprecedented value of 0.05% $X_{0}$  per layer. Its three layers are based on Mon...

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Autor principal: Kluge, A
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2022.167315
http://cds.cern.ch/record/2835874
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author Kluge, A
author_facet Kluge, A
author_sort Kluge, A
collection CERN
description ALICE is developing the ITS3 (inner tracker system) as upgrade of the inner layers of the presently installed ITS with the aim to improve the pointing resolution by factor of two and to lower the material budget to an unprecedented value of 0.05% $X_{0}$  per layer. Its three layers are based on Monolithic Active Pixel Sensors (MAPS) thinned down to 20–40 $\mu$m. The configuration employs half-cylinders, which are bent around the beam pipe with bending radii of 18, 24 and 30 mm, respectively. The sensors are produced using stitching techniques allowing to reach a length of 28 cm. As consequence, the detector consists of six MAPS sensors only. The material budget is kept to a minimum using carbon foam elements to hold the stitched sensors in place, as well as by employing airflow cooling. This contribution summarizes the achieved R&D; results on bending and thinning, the mechanical prototype, beam tests and the 65 nm prototype ASIC test, as well as the path towards the last remaining milestone, the implementation of a wafer-scale, stitched sensor design.
id cern-2835874
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2022
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spelling cern-28358742022-10-06T21:31:20Zdoi:10.1016/j.nima.2022.167315http://cds.cern.ch/record/2835874engKluge, AALICE - ITS3 — A bent, wafer-scale CMOS detectorDetectors and Experimental TechniquesALICE is developing the ITS3 (inner tracker system) as upgrade of the inner layers of the presently installed ITS with the aim to improve the pointing resolution by factor of two and to lower the material budget to an unprecedented value of 0.05% $X_{0}$  per layer. Its three layers are based on Monolithic Active Pixel Sensors (MAPS) thinned down to 20–40 $\mu$m. The configuration employs half-cylinders, which are bent around the beam pipe with bending radii of 18, 24 and 30 mm, respectively. The sensors are produced using stitching techniques allowing to reach a length of 28 cm. As consequence, the detector consists of six MAPS sensors only. The material budget is kept to a minimum using carbon foam elements to hold the stitched sensors in place, as well as by employing airflow cooling. This contribution summarizes the achieved R&D; results on bending and thinning, the mechanical prototype, beam tests and the 65 nm prototype ASIC test, as well as the path towards the last remaining milestone, the implementation of a wafer-scale, stitched sensor design.oai:cds.cern.ch:28358742022
spellingShingle Detectors and Experimental Techniques
Kluge, A
ALICE - ITS3 — A bent, wafer-scale CMOS detector
title ALICE - ITS3 — A bent, wafer-scale CMOS detector
title_full ALICE - ITS3 — A bent, wafer-scale CMOS detector
title_fullStr ALICE - ITS3 — A bent, wafer-scale CMOS detector
title_full_unstemmed ALICE - ITS3 — A bent, wafer-scale CMOS detector
title_short ALICE - ITS3 — A bent, wafer-scale CMOS detector
title_sort alice - its3 — a bent, wafer-scale cmos detector
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2022.167315
http://cds.cern.ch/record/2835874
work_keys_str_mv AT klugea aliceits3abentwaferscalecmosdetector