Cargando…
Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology
In this work the initial performance studies of the first small monolithic pixel sensors dedicated to charged particle detection, called CE-65, fabricated in the 65nm TowerJazz Panasonic Semiconductor Company are presented. The tested prototypes comprise matrices of 64 $\times$ 32 square analogue-ou...
Autores principales: | Bugiel, Szymon, Dorokhov, Andrei, Aresti, Mauro, Baudot, Jerome, Beole, Stefania, Besson, Auguste, Bugiel, Roma, Cecconi, Leonardo, Colledani, Claude, Deng, Wenjing, Di Mauro, Antonello, Bitar, Ziad El, Goffe, Mathieu, Hasenbichler, Jan, Hong, Geun Hee, Hu-Guo, Christine, Jaaskelainen, Kimmo, Kluge, Alex, Mager, Magnus, Marras, Davide, de Melo, Joao, Munker, Magdalena, Pham, Hung, Piro, Francesco, Reidt, Felix, Rinella, Gianluca Aglieri, Russo, Roberto, Sarritzu, Valerio, Senyukov, Serhiy, Snoeys, Walter, Suljic, Miljenko, Usai, Gianluca, Valin, Isabelle, Winter, Marc, Wu, Yitao |
---|---|
Lenguaje: | eng |
Publicado: |
2022
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2022.167213 http://cds.cern.ch/record/2835877 |
Ejemplares similares
-
Design of an analog monolithic pixel sensor prototype in TPSCo 65 nm CMOS imaging technology
por: Deng, W, et al.
Publicado: (2023) -
Design and readout architecture of a monolithic binary active pixel sensor in TPSCo 65 nm CMOS imaging technology
por: Cecconi, L, et al.
Publicado: (2023) -
Charged particle detection performances of CMOS pixel sensors produced in a 0.18$\nu$m process with a high resistivity epitaxial layer
por: Senyukov, Serhiy, et al.
Publicado: (2013) -
Optimisation of CMOS pixel sensors for high performance vertexing and tracking
por: Baudot, Jérôme, et al.
Publicado: (2013) -
Digital Pixel Test Structures implemented in a 65 nm CMOS process
por: Rinella, Gianluca Aglieri, et al.
Publicado: (2022)