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Current status of the End-of-Substructure (EoS) card project for the ATLAS Strip Tracker Upgrade using final ASICs

The silicon tracker of the ATLAS experiment will be upgraded for the upcoming High-Luminosity Upgrade of the LHC (HL-LHC). The main building blocks of the new strip tracker are modules that consist of silicon sensors and hybrid PCBs hosting the read-out ASICs. The modules are mounted on rigid carbon...

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Detalles Bibliográficos
Autores principales: Boebel, Artur Lorenz, Ceslik, Harald, Dam, Mogens, Diez Cornell, Sergio, Garvey, Cameron Michael, Goettlicher, Peter, Gregor, Ingrid, Keaveney, James Michael, Van Der Merwe, Max Nikoi, Oechsle, Jan, Schmitt, Stefan, Stanitzki, Marcel, Strom, Lars Rickard, Wyngaard, Janet Ruth
Lenguaje:eng
Publicado: 2022
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/18/03/C03016
http://cds.cern.ch/record/2836427
Descripción
Sumario:The silicon tracker of the ATLAS experiment will be upgraded for the upcoming High-Luminosity Upgrade of the LHC (HL-LHC). The main building blocks of the new strip tracker are modules that consist of silicon sensors and hybrid PCBs hosting the read-out ASICs. The modules are mounted on rigid carbon-fibre substructures, that provide common services to all the modules. At the end of each substructure, a so-called End-of-Substructure (EoS) card facilitates the transfer of data, power, high voltage and control signals between the modules and the off-detector systems. The module front-end electronics transfer data to the EoS card on 640Mbit/s differential lines. The EoS connects up to 28 data lines to one or two lpGBT chips that provide data serialisation and uses a 10GBit/s versatile optical link (VTRx+) to transmit signals to the off-detector systems. The lpGBT also recovers the LHC clock on the down-link and generates clock and control signals for the modules. To meet the tight integration requirements in the detector, several different EoS card designs are needed. Production-ready EoS card’s electronic design integrating final lpGBTv1 and VTRx+ ASICs from CERN are described, as well as results from recent quality assurance tests including detailed characterisation of the opto-electronics system by its bit error rate, jitter, and eye diagram representation. Since each EoS sits at a single-point-of-failure for an entire side of a substructure, a dedicated quality control (QC) procedure for the production has been developed.