SEE Testing on commercial power MOSFETs

This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET reference...

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Detalles Bibliográficos
Autores principales: Fernández-Martínez, Pablo, Papadopoulou, Athina, Danzeca, Salvatore, Foucard, Gilles, Alía, Rubén García, Kastriotou, Maria, Cazzaniga, Carlo, Tsiligiannis, Giorgos, Gaillard, Remi
Lenguaje:eng
Publicado: 2020
Acceso en línea:https://dx.doi.org/10.1109/RADECS50773.2020.9857706
http://cds.cern.ch/record/2836709
Descripción
Sumario:This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET references, allowing for a comparison of their respective Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) sensitiveness under different energy and particle irradiation conditions.

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