SEE Testing on commercial power MOSFETs

This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET reference...

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Detalles Bibliográficos
Autores principales: Fernández-Martínez, Pablo, Papadopoulou, Athina, Danzeca, Salvatore, Foucard, Gilles, Alía, Rubén García, Kastriotou, Maria, Cazzaniga, Carlo, Tsiligiannis, Giorgos, Gaillard, Remi
Lenguaje:eng
Publicado: 2020
Acceso en línea:https://dx.doi.org/10.1109/RADECS50773.2020.9857706
http://cds.cern.ch/record/2836709
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author Fernández-Martínez, Pablo
Papadopoulou, Athina
Danzeca, Salvatore
Foucard, Gilles
Alía, Rubén García
Kastriotou, Maria
Cazzaniga, Carlo
Tsiligiannis, Giorgos
Gaillard, Remi
author_facet Fernández-Martínez, Pablo
Papadopoulou, Athina
Danzeca, Salvatore
Foucard, Gilles
Alía, Rubén García
Kastriotou, Maria
Cazzaniga, Carlo
Tsiligiannis, Giorgos
Gaillard, Remi
author_sort Fernández-Martínez, Pablo
collection CERN
description This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET references, allowing for a comparison of their respective Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) sensitiveness under different energy and particle irradiation conditions.
id cern-2836709
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
record_format invenio
spelling cern-28367092022-11-17T14:41:41Zdoi:10.1109/RADECS50773.2020.9857706http://cds.cern.ch/record/2836709engFernández-Martínez, PabloPapadopoulou, AthinaDanzeca, SalvatoreFoucard, GillesAlía, Rubén GarcíaKastriotou, MariaCazzaniga, CarloTsiligiannis, GiorgosGaillard, RemiSEE Testing on commercial power MOSFETsThis work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET references, allowing for a comparison of their respective Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) sensitiveness under different energy and particle irradiation conditions.oai:cds.cern.ch:28367092020
spellingShingle Fernández-Martínez, Pablo
Papadopoulou, Athina
Danzeca, Salvatore
Foucard, Gilles
Alía, Rubén García
Kastriotou, Maria
Cazzaniga, Carlo
Tsiligiannis, Giorgos
Gaillard, Remi
SEE Testing on commercial power MOSFETs
title SEE Testing on commercial power MOSFETs
title_full SEE Testing on commercial power MOSFETs
title_fullStr SEE Testing on commercial power MOSFETs
title_full_unstemmed SEE Testing on commercial power MOSFETs
title_short SEE Testing on commercial power MOSFETs
title_sort see testing on commercial power mosfets
url https://dx.doi.org/10.1109/RADECS50773.2020.9857706
http://cds.cern.ch/record/2836709
work_keys_str_mv AT fernandezmartinezpablo seetestingoncommercialpowermosfets
AT papadopoulouathina seetestingoncommercialpowermosfets
AT danzecasalvatore seetestingoncommercialpowermosfets
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AT aliarubengarcia seetestingoncommercialpowermosfets
AT kastriotoumaria seetestingoncommercialpowermosfets
AT cazzanigacarlo seetestingoncommercialpowermosfets
AT tsiligiannisgiorgos seetestingoncommercialpowermosfets
AT gaillardremi seetestingoncommercialpowermosfets

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