BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules

The Inner Tracker silicon strip detector (ITk Strips) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event E...

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Detalles Bibliográficos
Autores principales: Roberts, Benjamin Ryan, Wall, Andie, Sawyer, Craig, Krizka, Karol, Gallop, Bruce Joseph, Mullier, Geoffrey, Wang, Haichen, Warren, Matthew, Keener, Paul, Poley, Anne-Luise, Helling, Cole Michael, Dandoy, Jeff, McGovern, Bobby, Gosart, Thomas Christopher, Belanger-Champagne, Camille
Lenguaje:eng
Publicado: 2022
Materias:
Particle Physics - Experiment
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/18/01/C01019
http://cds.cern.ch/record/2837867
Descripción
Sumario:The Inner Tracker silicon strip detector (ITk Strips) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.

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