BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules

The Inner Tracker silicon strip detector (ITk Strips) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event E...

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Detalles Bibliográficos
Autores principales: Roberts, Benjamin Ryan, Wall, Andie, Sawyer, Craig, Krizka, Karol, Gallop, Bruce Joseph, Mullier, Geoffrey, Wang, Haichen, Warren, Matthew, Keener, Paul, Poley, Anne-Luise, Helling, Cole Michael, Dandoy, Jeff, McGovern, Bobby, Gosart, Thomas Christopher, Belanger-Champagne, Camille
Lenguaje:eng
Publicado: 2022
Materias:
Particle Physics - Experiment
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/18/01/C01019
http://cds.cern.ch/record/2837867
_version_ 1780975894774415360
author Roberts, Benjamin Ryan
Wall, Andie
Sawyer, Craig
Krizka, Karol
Gallop, Bruce Joseph
Mullier, Geoffrey
Wang, Haichen
Warren, Matthew
Keener, Paul
Poley, Anne-Luise
Helling, Cole Michael
Dandoy, Jeff
McGovern, Bobby
Gosart, Thomas Christopher
Belanger-Champagne, Camille
author_facet Roberts, Benjamin Ryan
Wall, Andie
Sawyer, Craig
Krizka, Karol
Gallop, Bruce Joseph
Mullier, Geoffrey
Wang, Haichen
Warren, Matthew
Keener, Paul
Poley, Anne-Luise
Helling, Cole Michael
Dandoy, Jeff
McGovern, Bobby
Gosart, Thomas Christopher
Belanger-Champagne, Camille
author_sort Roberts, Benjamin Ryan
collection CERN
description The Inner Tracker silicon strip detector (ITk Strips) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.
id cern-2837867
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2022
record_format invenio
spelling cern-28378672023-06-13T18:24:21Zdoi:10.1088/1748-0221/18/01/C01019http://cds.cern.ch/record/2837867engRoberts, Benjamin RyanWall, AndieSawyer, CraigKrizka, KarolGallop, Bruce JosephMullier, GeoffreyWang, HaichenWarren, MatthewKeener, PaulPoley, Anne-LuiseHelling, Cole MichaelDandoy, JeffMcGovern, BobbyGosart, Thomas ChristopherBelanger-Champagne, CamilleBETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips ModulesParticle Physics - ExperimentThe Inner Tracker silicon strip detector (ITk Strips) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.ATL-ITK-PROC-2022-030oai:cds.cern.ch:28378672022-10-20
spellingShingle Particle Physics - Experiment
Roberts, Benjamin Ryan
Wall, Andie
Sawyer, Craig
Krizka, Karol
Gallop, Bruce Joseph
Mullier, Geoffrey
Wang, Haichen
Warren, Matthew
Keener, Paul
Poley, Anne-Luise
Helling, Cole Michael
Dandoy, Jeff
McGovern, Bobby
Gosart, Thomas Christopher
Belanger-Champagne, Camille
BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules
title BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules
title_full BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules
title_fullStr BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules
title_full_unstemmed BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules
title_short BETSEE: Testing for System-Wide Effects of Single Event Effects on ITk Strips Modules
title_sort betsee: testing for system-wide effects of single event effects on itk strips modules
topic Particle Physics - Experiment
url https://dx.doi.org/10.1088/1748-0221/18/01/C01019
http://cds.cern.ch/record/2837867
work_keys_str_mv AT robertsbenjaminryan betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT wallandie betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT sawyercraig betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT krizkakarol betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT gallopbrucejoseph betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT mulliergeoffrey betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT wanghaichen betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT warrenmatthew betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT keenerpaul betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT poleyanneluise betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT hellingcolemichael betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT dandoyjeff betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT mcgovernbobby betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT gosartthomaschristopher betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules
AT belangerchampagnecamille betseetestingforsystemwideeffectsofsingleeventeffectsonitkstripsmodules

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