Pulsed Electron Beam induced SEU Effects in a SRAM memory

Single Event Effects (SEEs) correlated to pulsed beam effects induced by high energy electrons in a very well-established device, such as the ESA SEU (Singe Event Upset) monitor, are investigated in this paper. Measurements with different electron intensities have been performed at VESPER (The Very...

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Detalles Bibliográficos
Autores principales: Wyrwoll, Vanessa, Røed, Ketil, Alía, Rubén García, Delfs, Björn, Coronetti, Andrea, Farabolini, Wilfrid, Gilardi, Antonio, Corsini, Roberto
Lenguaje:eng
Publicado: 2021
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/RADECS53308.2021.9954561
http://cds.cern.ch/record/2846305
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author Wyrwoll, Vanessa
Røed, Ketil
Alía, Rubén García
Delfs, Björn
Coronetti, Andrea
Farabolini, Wilfrid
Gilardi, Antonio
Corsini, Roberto
author_facet Wyrwoll, Vanessa
Røed, Ketil
Alía, Rubén García
Delfs, Björn
Coronetti, Andrea
Farabolini, Wilfrid
Gilardi, Antonio
Corsini, Roberto
author_sort Wyrwoll, Vanessa
collection CERN
description Single Event Effects (SEEs) correlated to pulsed beam effects induced by high energy electrons in a very well-established device, such as the ESA SEU (Singe Event Upset) monitor, are investigated in this paper. Measurements with different electron intensities have been performed at VESPER (The Very energetic Electron facility for Space Planetary Exploration missions in harsh Radiative environments) at the CERN Linear Electron Accelerator for Research (CLEAR) focused on very high dose rates per pulse. The possible contribution of electron nuclear events and flash effects is discussed.
id cern-2846305
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2021
record_format invenio
spelling cern-28463052023-01-18T19:35:42Zdoi:10.1109/RADECS53308.2021.9954561http://cds.cern.ch/record/2846305engWyrwoll, VanessaRøed, KetilAlía, Rubén GarcíaDelfs, BjörnCoronetti, AndreaFarabolini, WilfridGilardi, AntonioCorsini, RobertoPulsed Electron Beam induced SEU Effects in a SRAM memoryDetectors and Experimental TechniquesSingle Event Effects (SEEs) correlated to pulsed beam effects induced by high energy electrons in a very well-established device, such as the ESA SEU (Singe Event Upset) monitor, are investigated in this paper. Measurements with different electron intensities have been performed at VESPER (The Very energetic Electron facility for Space Planetary Exploration missions in harsh Radiative environments) at the CERN Linear Electron Accelerator for Research (CLEAR) focused on very high dose rates per pulse. The possible contribution of electron nuclear events and flash effects is discussed.oai:cds.cern.ch:28463052021
spellingShingle Detectors and Experimental Techniques
Wyrwoll, Vanessa
Røed, Ketil
Alía, Rubén García
Delfs, Björn
Coronetti, Andrea
Farabolini, Wilfrid
Gilardi, Antonio
Corsini, Roberto
Pulsed Electron Beam induced SEU Effects in a SRAM memory
title Pulsed Electron Beam induced SEU Effects in a SRAM memory
title_full Pulsed Electron Beam induced SEU Effects in a SRAM memory
title_fullStr Pulsed Electron Beam induced SEU Effects in a SRAM memory
title_full_unstemmed Pulsed Electron Beam induced SEU Effects in a SRAM memory
title_short Pulsed Electron Beam induced SEU Effects in a SRAM memory
title_sort pulsed electron beam induced seu effects in a sram memory
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/RADECS53308.2021.9954561
http://cds.cern.ch/record/2846305
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AT aliarubengarcia pulsedelectronbeaminducedseueffectsinasrammemory
AT delfsbjorn pulsedelectronbeaminducedseueffectsinasrammemory
AT coronettiandrea pulsedelectronbeaminducedseueffectsinasrammemory
AT faraboliniwilfrid pulsedelectronbeaminducedseueffectsinasrammemory
AT gilardiantonio pulsedelectronbeaminducedseueffectsinasrammemory
AT corsiniroberto pulsedelectronbeaminducedseueffectsinasrammemory

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