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Reliability testing of Power Schottky Diodes used for high current rectifying
This project was done in cooperation with the TE-EPC-LPC section at CERN. They were experiencing failures in one of their power converter from the rectifying power diodes, and were interested in finding the reason for the failure. They were observing a high leakage current in some of the diodes. The...
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| Lenguaje: | eng |
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2014
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| Acceso en línea: | http://cds.cern.ch/record/2847605 |