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Tracker alignment in CMS: interplay with pixel local reconstruction

The CMS silicon tracking system measures the trajectories of charged particles with a hit resolution of the order of microns in the pixel detector and tens of microns in the strip detector. One of the most important inputs for track reconstruction is the precision with which the tracker geometry is...

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Detalles Bibliográficos
Autor principal: Ventura Barroso, Ana
Lenguaje:eng
Publicado: 2023
Materias:
Acceso en línea:https://dx.doi.org/10.22323/1.420.0079
http://cds.cern.ch/record/2848347