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Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield

Ultrashort-pulse laser processing of copper is performed in air to reduce the secondary electron yield (SEY). By UV (355 nm), green (532 nm), and IR (1064 nm) laser-light induced surface modification, this study investigates the influence of the most relevant experimental parameters, such as laser p...

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Autores principales: Bez, Elena, Himmerlich, Marcel, Lorenz, Pierre, Ehrhardt, Martin, Gunn, Aidan Graham, Pfeiffer, Stephan, Rimoldi, Martino, Taborelli, Mauro, Zimmer, Klaus, Chiggiato, Paolo, Anders, André
Lenguaje:eng
Publicado: 2023
Materias:
Acceso en línea:https://dx.doi.org/10.1063/5.0131916
http://cds.cern.ch/record/2848748
_version_ 1780976862564974592
author Bez, Elena
Himmerlich, Marcel
Lorenz, Pierre
Ehrhardt, Martin
Gunn, Aidan Graham
Pfeiffer, Stephan
Rimoldi, Martino
Taborelli, Mauro
Zimmer, Klaus
Chiggiato, Paolo
Anders, André
author_facet Bez, Elena
Himmerlich, Marcel
Lorenz, Pierre
Ehrhardt, Martin
Gunn, Aidan Graham
Pfeiffer, Stephan
Rimoldi, Martino
Taborelli, Mauro
Zimmer, Klaus
Chiggiato, Paolo
Anders, André
author_sort Bez, Elena
collection CERN
description Ultrashort-pulse laser processing of copper is performed in air to reduce the secondary electron yield (SEY). By UV (355 nm), green (532 nm), and IR (1064 nm) laser-light induced surface modification, this study investigates the influence of the most relevant experimental parameters, such as laser power, scanning speed, and scanning line distance (represented as accumulated fluence) on the ablation depth, surface oxidation, topography, and ultimately on the SEY. Increasing the accumulated laser fluence results in a gradual change from a Cu2O to a CuO-dominated surface with deeper micrometer trenches, higher density of redeposited surface particles from the plasma phase, and a reduced SEY. While the surface modifications are less pronounced for IR radiation at low accumulated fluence (<1000 J/cm2), analogous results are obtained for all wavelengths when reaching the nonlinear absorption regime, for which the SEY maximum converges to 0.7. Furthermore, independent of the extent of the structural transformations, an electron-induced surface conditioning at 250 eV allows a reduction of the SEY maximum below unity at doses of 5×10-4 C/mm2. Consequently, optimization of processing parameters for application in particle accelerators can be obtained for a sufficiently low SEY at controlled ablation depth and surface particle density, which are factors that limit the surface impedance and the applicability of the material processing for ultrahigh vacuum systems. The relations between processing parameters and surface features will provide guidance in treating the surface of vacuum components, especially beam screens of selected magnets of the Large Hadron Collider or of future colliders.
id cern-2848748
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2023
record_format invenio
spelling cern-28487482023-03-28T14:13:47Zdoi:10.1063/5.0131916http://cds.cern.ch/record/2848748engBez, ElenaHimmerlich, MarcelLorenz, PierreEhrhardt, MartinGunn, Aidan GrahamPfeiffer, StephanRimoldi, MartinoTaborelli, MauroZimmer, KlausChiggiato, PaoloAnders, AndréInfluence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yieldAccelerators and Storage RingsUltrashort-pulse laser processing of copper is performed in air to reduce the secondary electron yield (SEY). By UV (355 nm), green (532 nm), and IR (1064 nm) laser-light induced surface modification, this study investigates the influence of the most relevant experimental parameters, such as laser power, scanning speed, and scanning line distance (represented as accumulated fluence) on the ablation depth, surface oxidation, topography, and ultimately on the SEY. Increasing the accumulated laser fluence results in a gradual change from a Cu2O to a CuO-dominated surface with deeper micrometer trenches, higher density of redeposited surface particles from the plasma phase, and a reduced SEY. While the surface modifications are less pronounced for IR radiation at low accumulated fluence (<1000 J/cm2), analogous results are obtained for all wavelengths when reaching the nonlinear absorption regime, for which the SEY maximum converges to 0.7. Furthermore, independent of the extent of the structural transformations, an electron-induced surface conditioning at 250 eV allows a reduction of the SEY maximum below unity at doses of 5×10-4 C/mm2. Consequently, optimization of processing parameters for application in particle accelerators can be obtained for a sufficiently low SEY at controlled ablation depth and surface particle density, which are factors that limit the surface impedance and the applicability of the material processing for ultrahigh vacuum systems. The relations between processing parameters and surface features will provide guidance in treating the surface of vacuum components, especially beam screens of selected magnets of the Large Hadron Collider or of future colliders.oai:cds.cern.ch:28487482023
spellingShingle Accelerators and Storage Rings
Bez, Elena
Himmerlich, Marcel
Lorenz, Pierre
Ehrhardt, Martin
Gunn, Aidan Graham
Pfeiffer, Stephan
Rimoldi, Martino
Taborelli, Mauro
Zimmer, Klaus
Chiggiato, Paolo
Anders, André
Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
title Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
title_full Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
title_fullStr Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
title_full_unstemmed Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
title_short Influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
title_sort influence of wavelength and accumulated fluence at picosecond laser-induced surface roughening of copper on secondary electron yield
topic Accelerators and Storage Rings
url https://dx.doi.org/10.1063/5.0131916
http://cds.cern.ch/record/2848748
work_keys_str_mv AT bezelena influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT himmerlichmarcel influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT lorenzpierre influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT ehrhardtmartin influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT gunnaidangraham influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT pfeifferstephan influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT rimoldimartino influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT taborellimauro influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT zimmerklaus influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT chiggiatopaolo influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield
AT andersandre influenceofwavelengthandaccumulatedfluenceatpicosecondlaserinducedsurfacerougheningofcopperonsecondaryelectronyield