Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines

The CERN fixed target experimental areas have recently acquired new importance thanks to newly proposed experiments, such as those linked to Physics Beyond Colliders (PBC) activities. Secondary Emission Monitors (SEMs) are the instruments currently used for measuring beam current, position and size in these areas. Guaranteeing their reliability, resistance to radiation and measurement precision is challenging. This paper presents the studies being conducted to understand ageing effects on SEM devices, to calibrate and optimise the SEM design for future use in these beamlines. These include feasibility studies for the application of machine learning techniques, with the objective of expanding the range of tools available for data analysis.